Ellipsometry at the nanoscale/ ed by Maria Losurdo and Kurt Hingerl.
Publication details: New York : Springer, 2012.Description: xxiv, 730pISBN:- 9783642339554
- 620.112 95 Q32
Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
Books | Mahatma Gandhi University Library General Stacks | 620.112 95 Q32 (Browse shelf(Opens below)) | Available | 52652 |
Total holds: 0
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